The EBE-Series Electron Beam Evaporation System is engineered for physical vapor deposition (PVD) of high-melting-point metals, dielectrics, and optical materials. By utilizing a magnetically deflected, focused electron beam directly onto source materials within water-cooled crucibles, the system achieves high deposition rates while maintaining a contamination-free vacuum environment.
Targeted at production lines and advanced research laboratories, this platform supports multi-layer thin-film fabrication with precise rate control, making it suitable for optical interference filters, semiconductor metallization, and wear-resistant coatings.
Technical Specifications
|
Parameter |
Specification |
|
Base Pressure |
≤ 5 × 10⁻⁷ Torr (Achieved within 45 minutes) |
|
E-Gun Power Rating |
3 kW to 10 kW (Sweep frequency: 0–100 Hz, programmable) |
|
Crucible Configuration |
4 to 6 pockets; capacity from 7 cc to 40 cc per pocket |
|
Substrate Stage |
Water/heater-cooled; rotation speed 0–30 RPM; bias voltage option available |
|
Film Thickness Control |
Dual-channel QCM controller (Resolution: 0.03 Å); optical monitoring optional |
|
Chamber Dimensions |
304L Stainless steel, electropolished; inner diameter 500 mm to 800 mm |
|
Pumping Package |
Turbo molecular pump (1200 L/s) backed by a rotary vane/scroll dry pump |
Key Features
Magnetic Beam Deflection: 270° bending e-gun geometry keeps the filament shielded from direct line-of-sight material spitting, preventing short circuits and filament degradation.
Closed-Loop Rate Control: Integrates multi-channel quartz crystal sensors with proportional-integral-derivative (PID) algorithm output to regulate e-emission current and deposition speed dynamically.
Modular Crucible Deck: Indexing mechanism utilizes ferrofluidic feedthroughs and direct-drive stepper motors for rapid, particle-free crucible switching under vacuum.
Interlocked Safety Architecture: Hardware-level interlocks monitor cooling water flow, vacuum thresholds, and chamber door status to protect operators and high-voltage components.
Vacuum System Configuration
The vacuum sub-assembly is built for baseline cleanliness and rapid cycling:
Roughing & Foreline: Oil-free dry scroll pump (capacity: 30 m³/h) eliminates hydrocarbon backstreaming into the main chamber.
High Vacuum: Compound turbo-molecular pump backed by electropneumatic gate valves and pneumatic angle valves.
Pressure Monitoring: Combined Pirani and Bayard-Alpert ion gauges deliver real-time feedback across atmosphere to ultra-high vacuum (10⁻⁹ Torr).
Bakeout Capability: Optional quartz infrared heaters or jacket heaters enable chamber thermal degassing to reach base pressure thresholds faster.
Film Materials & Substrates
Supported Source Materials
Refractory Metals: Ti, Ta, W, Mo, Cr, Ni, Au, Ag, Al, Cu.
Dielectrics & Oxides: SiO₂, TiO₂, Ta₂O₅, Al₂O₃, HfO₂, Nb₂O₅.
Substrate Compatibility
Semiconductor Wafers: 2-inch to 8-inch silicon, GaAs, sapphire.
Optical Substrates: Fused silica, BK7, Zerodur, germanium, and zinc selenide lenses/prisms.
Flexible Substrates: Polyimide films (via specialized roll-to-roll or carrier plate fixtures).
Applications
Laser Optics: Deposition of low-scatter, high-laser-damage-threshold (LIDT) dielectric stacks (TiO₂/SiO₂) for high-power mirrors and beamsplitters.
Semiconductor & Microelectronics: Gate metal deposition, ohmic contact formation, and lift-off metallization processes for discrete devices and sensors.
Optoelectronics: Transparent conductive oxide (TCO) layers and metal cathode evaporation for OLED and photovoltaic cell fabrication.
Customization Options
Every production environment has unique layout and integration constraints. Factory engineering modifications include:
Chamber Geometry: Custom port placements for in-situ diagnostics (e.g., Ellipsometry, SIMS, or RHEED).
Load-Lock Integration: Linear magnetic transfer arms or automatic pneumatic fork transfer to connect with cluster tools or glovebox lines.
Substrate Biasing & Heating: RF/DC bias power supplies for ion-assisted deposition (IAD) and substrate heating up to 800°C.
PLC & HMI Localization: Siemens S7 or Allen-Bradley PLC control architectures meeting specific plant automation protocols.
Quality Control & Testing
Leak Testing: Every welded stainless steel chamber is helium mass spectrometer leak-tested to a sensitivity of < 1 × 10⁻⁹ Pa·m³/s prior to assembly.
High-Voltage Insulation Test: E-gun power supplies undergo dielectric withstand testing at 1.5× rated voltage plus 1000V for 60 seconds.
Factory Acceptance Test (FAT): Systems undergo a continuous 72-hour burn-in test, verifying pumping speed curves, e-gun sweep calibration, and film thickness uniformity across test substrates before crating.
Installation & Technical Support
Documentation Package: Comprehensive manuals including electrical schematics, P&ID diagrams, PLC source codes, material safety data sheets, and calibration certificates.
On-Site Services: Factory-certified service engineers handle mechanical assembly, utility hookups (cooling water, exhaust, power), and site acceptance testing (SAT).
Remote Diagnostics: Secure VPN router integration allows remote troubleshooting, parameter optimization, and software updates by senior process engineers.
Frequently Asked Questions
Q: What is the standard pump-down time to reach operational base pressure?
A: Using the standard 1200 L/s turbo-molecular pump configuration, an empty, dry chamber reaches ≤ 5 × 10⁻⁷ Torr in less than 45 minutes from atmosphere.
Q: How does the system prevent cross-contamination between different materials?
A: The system utilizes a multi-pocket crucible hearth enclosed in a water-cooled copper block, combined with an automated physical shutter system that isolates pockets during idle or pre-melting phases.
Q: Can this system be integrated into an existing inert-atmosphere glovebox?
A: Yes. We offer custom flange adaptations and gate valve configurations on the chamber side or rear wall to dock directly with standard gloveboxes for air-sensitive material handling.
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