The EBE-V600 series is an industrial-scale physical vapor deposition (PVD) platform designed for precise thin-film coating of optical components, semiconductor devices, and advanced materials. By directing a high-energy, magnetically focused electron beam onto source materials inside water-cooled crucibles, the system achieves rapid evaporation rates while keeping thermal loads isolated from the chamber walls.
The architecture incorporates multi-pocket electron sources and dual quartz crystal microbalance (QCM) sensors, ensuring stoichiometric film fidelity and consistent thickness control across multi-layer dielectric or metallic stacks.
Technical Specifications
|
Technical Parameter |
Specification Value |
|
Chamber Geometry & Material |
Φ600 mm x 600 mm cylindrical vessel; SS304 electropolished interior with external cooling water jackets |
|
Ultimate Base Pressure |
<= 5.0 x 10^-5 Pa (achieved via 12-hour bake-out and high-vacuum pumping) |
|
Pump-down Cycle Time |
<= 15 minutes (From atmosphere to 1.0 x 10^-3 Pa) |
|
Electron Gun Power |
6 kW to 12 kW multi-pocket configuration with 270° beam deflection |
|
Crucible Hearth Capacity |
4 to 6 pockets (Interchangeable copper/graphite crucibles, 15cc to 40cc volume per pocket) |
|
Substrate Stage Rotation |
0 to 30 RPM variable speed planetary or direct drive |
|
Substrate Heating Range |
Ambient to 600°C via PID closed-loop halogen lamp array |
|
Thickness Monitoring |
Dual QCM sensors with automatic shutter feedback control |
Key Features
270° Magnetic Deflection E-Gun: Isolates the tungsten filament from direct vapor paths, preventing short-circuiting and extending operational life between maintenance intervals.
Digital Sweep Control: Programmable raster patterns distribute electron energy uniformly across the evaporant surface, mitigating pinhole formation and preferential evaporation during alloy deposition.
Decoupled Vacuum Architecture: Roughing and high-vacuum pumping lines are structurally isolated from the main chamber frame to suppress mechanical vibration transfer during film growth.
Hardware Interlock Safety Matrix: Real-time PLC monitoring of cooling water flow, high-voltage feedback, pneumatic pressure, and door seal integrity.
Vacuum System Configuration
The vacuum sub-circuit is engineered for rapid cycling and low base pressure to minimize residual gas incorporation (H2O, O2, N2) in growing films:
High-Vacuum Pump: 1200 L/s turbo-molecular pump backed by a dual-stage rotary vane pump (or dry scroll pump configuration for cleanroom compliance).
Isolation Valve: Pneumatically actuated high-conductance gate valve isolating the chamber during load operations.
Vacuum Measurement: Combined Pirani and Cold Cathode ionization gauges covering continuous range from atmosphere to 10^-6 Pa.
Film Materials & Substrates
Compatible Evaporant Sources
Oxides & Dielectrics: SiO2, TiO2, Ta2O5, Al2O3, HfO2
Pure Metals: Au, Ag, Al, Ti, Cr, Pt, Ni
Semiconductors & Conductors: Si, Ge, ITO (Indium Tin Oxide)
Applications
Optical Interference Filters: High-index and low-index multi-layer stack deposition for narrow-band pass filters and laser mirrors.
Semiconductor Device Fabrication: Ohmic contact formation, gate oxide deposition, and metal seed layers.
OLED & Display Research: Thin metallic cathode deposition and multi-layer organic/inorganic passivation tests.
Hard Refractory Coatings: Protective wear-resistant layers for mechanical and aerospace components.
Customization
Chamber Expansion: Extended vessel heights or rectangular geometries tailored for cluster tool integration.
Source Integration: Concurrent thermal evaporation sources (resistive boats) combined with electron beam guns.
Ion-Assisted Deposition (IAD): Integration of an end-Hall or Kaufman ion source for film densification and stress tuning.
Software Architecture: PLC/HMI recipe programming compliant with Siemens S7 or Beckhoff automation frameworks.
Quality Control
Mass Spectrometer Helium Leak Testing: Every chamber weldment is tested to a rejection threshold of < 1 x 10^-9 Pa·m3/s prior to integration.
Electrical Compliance: High-voltage dielectric withstand tests and grounding continuity verification per CE/UL guidelines.
Factory Acceptance Testing (FAT): 72-hour continuous dry-run test logging base pressure curves, e-beam sweep repeatability, and interlock response times. Test documentation shipped with the unit.
Installation & Technical Support
Site Commissioning: Factory-certified engineers manage mechanical alignment, vacuum leak verification, utility connection supervision, and initial calibration runs.
Technical Training: 3-day on-site operational and maintenance protocol training covering filament replacement, vacuum valve rebuilding, and recipe editing.
Documentation Deliverables: Complete technical binders including P&ID schematics, electrical wiring diagrams, PLC backup files, and spare parts itemization.
Frequently Asked Questions
Q: What is the operational lifespan of the e-gun tungsten filament, and how is it serviced?
A: Under standard working pressures (<= 10^-4 Pa) and clean source materials, filament lifespan averages 30 to 50 operational hours. A quick-access vacuum flange allows cartridge exchange within 20 minutes without venting the entire manifold.
Q: How does the system prevent spitting during oxide deposition?
A: The digital sweep generator distributes electron energy across a calculated raster matrix on the oxide pellet. This eliminates localized overheating, prevents explosive boiling, and suppresses micro-droplet ejection.
Q: What utility infrastructures are mandatory at the installation site?
A: Cooling Water: Supply pressure 0.25 MPa to 0.4 MPa, flow rate >= 30 L/min, temperature 18°C to 25°C.
Electrical Grid: 3-phase, 380V ± 10%, 50/60 Hz (or factory-configured to regional standards).
Compressed Air: 0.5 MPa to 0.7 MPa dry air for pneumatic valve actuators.
Q: Is remote diagnostic access integrated into the control system?
A: Yes. An isolated Ethernet port supports secure VPN connection for remote PLC log retrieval and software troubleshooting by our engineering team.
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